Views Navigation

Event Views Navigation

Sampling from the SK measure via algorithmic stochastic localization

Ahmed El Alaoui, Cornell University
E18-304

Abstract: I will present an algorithm which efficiently samples from the Sherrington-Kirkpatrick (SK) measure with no external field at high temperature. The approach is based on the stochastic localization process of Eldan, together with a subroutine for computing the mean vectors of a family of SK measures tilted by an appropriate external field. This approach is general and can potentially be applied to other discrete or continuous non-log-concave problems. We show that the algorithm outputs a sample within vanishing rescaled Wasserstein…

Find out more »


MIT Statistics + Data Science Center
Massachusetts Institute of Technology
77 Massachusetts Avenue
Cambridge, MA 02139-4307
617-253-1764