Sampling from the SK measure via algorithmic stochastic localization
Abstract: I will present an algorithm which efficiently samples from the Sherrington-Kirkpatrick (SK) measure with no external field at high temperature. The approach is based on the stochastic localization process of Eldan, together with a subroutine for computing the mean vectors of a family of SK measures tilted by an appropriate external field. This approach is general and can potentially be applied to other discrete or continuous non-log-concave problems. We show that the algorithm outputs a sample within vanishing rescaled Wasserstein…